Search by property

This page provides a simple browsing interface for finding entities described by a property and a named value. Other available search interfaces include the page property search, and the ask query builder.

List of results

• RelativePermeability  + (Scalar quantity or tensor quantity equal to the absolute permeability divided by the magnetic constant.)
• ScalarData  + (ScalarData)
• ScalarMagneticPotential  + (ScalarMagneticPotential)
• ScalarMeson  + (ScalarMeson)
• Scandic Holmenkollen Park Hotel  + (Scandic Holmenkollen Park Hotel)
• Scandic Holmenkollen Park Hotel Picture.png  + (Scandic Holmenkollen Park Hotel Picture.png)
• Scandium  + (Scandium)
• ScandiumAtom  + (ScandiumAtom)
• ScandiumSymbol  + (ScandiumSymbol)
• Scanning Electron Microscopy (SEM)  + (Scanning Electron Microscopy (SEM))
• ScanningKelvinProbe  + (Scanning Kelvin probe (SKP) and scanning K … Scanning Kelvin probe (SKP) and scanning Kelvin probe force microscopy (SKPFM) are probe techniques which permit mapping of topography and Volta potential distribution on electrode surfaces. It measures the surface electrical potential of a sample without requiring an actual physical contact.hout requiring an actual physical contact.)
• ScanningTunnelingMicroscopy  + (Scanning Tunneling Microscopy, or STM, is an imaging technique used to obtain ultra-high resolution images at the atomic scale, without using light or electron beams.)
• ScanningProbeMicroscopy  + (Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.)
• ScanningAugerElectronMicroscopy  + (ScanningAugerElectronMicroscopy)
• ScanningElectronMicroscopy  + (ScanningElectronMicroscopy)
• ScanningKelvinProbe  + (ScanningKelvinProbe)
• ScanningProbeMicroscopy  + (ScanningProbeMicroscopy)
• ScanningTunnelingMicroscopy  + (ScanningTunnelingMicroscopy)
• ScatteringAndDiffraction  + (ScatteringAndDiffraction)
• Schema Template Tutorial  + (Schema Template Tutorial)
• Schema diagram  + (Schema diagram)
• diagram-json  + (Schema diagram json)
• Keyword  + (Schlagwort)
• Keyword  + (Schlüsselwort)
• Quick Start  + (Schnellstart)

• Faculty  + (School)

• Tutorial  + (Schriftliche oder filmische Gebrauchsanleitung)
• ScientificTheory  + (ScientificTheory)
• Scratch test  + (Scratch test)
• Screenshot-2024-05-03-094021.png  + (Screenshot-2024-05-03-094021.png)
• Screwing  + (Screwing)
• ScriptingLanguage  + (ScriptingLanguage)
• SeaborgiumAtom  + (SeaborgiumAtom)
• SeaborgiumSymbol  + (SeaborgiumSymbol)
• SealedCell  + (SealedCell)
• Sealing  + (Sealing)
• Search bar.png  + (Search bar.png)
• Seawater  + (Seawater)
• SebastianoMoruzzi  + (SebastianoMoruzzi)
• Second  + (Second)
• SecondPerMetre  + (Second per metre.)
• SecondPerRadianCubicMetre  + (Second per radian and cubic metre unit.)
• SecondAxialMomentOfArea  + (SecondAxialMomentOfArea)
• SecondPerMetre  + (SecondPerMetre)
• SecondPerRadianCubicMetre  + (SecondPerRadianCubicMetre)
• SecondPolarMomentOfArea  + (SecondPolarMomentOfArea)
• SecondaryIonMassSpectrometry  + (Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions.)
• SecondaryBattery  + (SecondaryBattery)
• SecondaryData  + (SecondaryData)
• SecondaryIonMassSpectrometry  + (SecondaryIonMassSpectrometry)
• SectionAreaIntegralUnit  + (SectionAreaIntegralUnit)