Microscopy
Category:OSW513f071ddc5b536691701e11a1e168fd /
| Microscopy | |
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| ID | OSW513f071ddc5b536691701e11a1e168fd |
| UUID | 513f071d-dc5b-5366-9170-1e11a1e168fd |
| Label | Microscopy |
| Machine compatible name | Microscopy |
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Description
Microscopy is a category of characterization techniques which probe and map the surface and sub-surface structure of a material. These techniques can use photons, electrons, ions or physical cantilever probes to gather data about a sample's structure on a range of length scales.
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| OWL Class | |
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| Imported fromA prefixed IRI defining this entry as a imported term. In OSW the prefix must be a registered imported ontology.<br>Definition: OWL Class | https://w3id.org/emmo/domain/characterisation-methodology/chameo#Microscopy |
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| Supercategories<br>Definition: Category (Class), OWL Class, EmmoClass | |
| metaclass<br>Definition: Category (Class), EmmoClass |
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| uuid | "513f071d-dc5b-5366-9170-1e11a1e168fd" | |||||||||||
| iri | "chameo:Microscopy" | |||||||||||
| name | "Microscopy" | |||||||||||
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| imported_from | "chameo:Microscopy" |
Subcategories
This category has the following 14 subcategories, out of 14 total.
O
- OpticalMicroscopy (empty)
- TransmissionElectronMicroscopy (empty)
- AnalyticalElectronMicroscopy (empty)
- ScanningProbeMicroscopy (empty)
- ScanningKelvinProbe (empty)
- ScanningAugerElectronMicroscopy (empty)
- PhotoluminescenceMicroscopy (empty)
- AtomicForceMicroscopy (empty)
- ConfocalMicroscopy (empty)
- ElectronProbeMicroanalysis (empty)
- ScanningTunnelingMicroscopy (empty)